Publications by authors named "William Heeschen"

Silver nanowire (AgNW) diameters are typically characterized by manual measurement from high magnification electron microscope images. Measurement is monotonous and has potential ergonomic hazards. Because of this, statistics regarding wire diameter distribution can be poor, costly, and low-throughput.

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A new method of image texture analysis is presented, based on the mean and standard deviation of gray levels within domains in an image. The calculations are performed recursively on domains of various sizes within the images. These gray level calculations are used as the input matrix for principal component analysis.

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The combination of integrated focused ion beam-scanning electron microscope (FIB-SEM) serial sectioning and imaging techniques with image analysis provided quantitative characterization of three-dimensional (3D) pigment dispersion in dried paint films. The focused ion beam in a FIB-SEM dual beam system enables great control in slicing paints, and the sectioning process can be synchronized with SEM imaging providing high quality serial cross-section images for 3D reconstruction. Application of Euclidean distance map and ultimate eroded points image analysis methods can provide quantitative characterization of 3D particle distribution.

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The objective of the present study was to improve our understanding of the relationships between wet film dimensions, dip sequences, and the physicochemical properties of the dip solutions as they pertain to the dip-coating process for the manufacture of hard-shell capsules. To achieve this objective, it was necessary to develop a technique to quantify wet film dimensions. A further objective was to develop a predictive model for dip coating with hydroxypropyl methylcellulose (HPMC) solutions.

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