Publications by authors named "Weinan Ye"

Grating interferometers that use large two-dimensional grating splice modules for performing wide-range measurements have significant advantages for identifying the position of the wafer stage. However, the manufacturing process of large two-dimensional grating splice modules is very difficult. In contrast to existing redundant designs in the grating line dimension, we propose a novel interferometric reading head with a redundant design for obtaining wide-range displacement measurements.

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A method for measuring the relative phases (RPs) among the three beams in the case of homodyne three-beam interference (TBI) is proposed and verified by the ZEMAX simulation in this paper. The method requires that the interference beams are not on the same plane, that is, any two of the three beams interfere at an angle in different planes. Based on the phase delay of the beam in space, the inclined beams have different phases at different positions within the beams' range.

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In this paper, the errors of the displacement measurement interferometer with multi-mode fiber-coupled delivery are analyzed when the fibers are disturbed. Simulation results show that the characteristic frequency of the measurement error is consistent with that of disturbance, and the error has higher order frequency components. The experiments are designed for the effect of fringe contrast on the measurement error.

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In the displacement measurement of the wafer stage in lithography machines, signal quality is affected by the relative angular position between the encoder head and the grating. In this study, a two-degree-of-freedom fiber-coupled heterodyne grating interferometer with large operating range of rotation is presented. Fibers without fiber couplers are utilized to receive the interference beams for high-contrast signals under the circumstances of large angular displacement and ZEMAX ray tracing software simulation and experimental validation have been carried out.

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Grating interferometry is an environmentally stable displacement measurement technique that has significant potential for identifying the position of the wafer stage. A fast and precise algorithm is required for real-time calculation of six degrees-of-freedom (DOF) displacement using phase shifts of interference signals. Based on affine transformation, we analyze diffraction spot displacement and changes in the internal and external effective optical paths of the grating interferometer caused by the displacement of the wafer stage (DOWS); then, we establish a phase shift-DOWS model.

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We present a three-degrees-of-freedom laser interferometer based on differential wavefront sensing with a wide angular measurement range. To obtain measurement signals with a high AC/DC ratio and improve the linearity of differential wavefront sensing in a wide range angular displacement measurement, a fiber bundle instead of a quadrant photodiode is applied to receive the interference light. Meanwhile, a decoupled algorithm with quadratic correction derived by the ray tracing method and kinematic analysis is detailed in the case of the wide range angular displacement.

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The translational displacement computational algorithm base on a novel phase-shift model is proposed eliminating the geometric error of the grating interferometer for precision positioning of a multi-degree-of-freedom motion stage. Firstly, the mechanism of the geometric error of the grating interferometer is analyzed, and the novel phase-shift model of the grating interferometer is constructed based on rigid body kinematics and affine geometry transformation. High accuracy of the model is demonstrated by ZEMAX simulation.

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