This paper shows the optical setup of a radial in-plane digital speckle pattern interferometer which uses an axis-symmetrical diffractive optical element (DOE) to obtain double illumination. The application of the DOE gives in-plane sensitivity which only depends on the grating period of the DOE instead of the wavelength of the laser used as illumination source. A compact optical layout was built in order to have a portable optical strain sensor with a circular measurement area of about 5 mm in diameter.
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