Optical and durability properties of infrared transmitting thin films.

Refractive indices and extinction coefficients have been calculated for 14 oxide and fluoride thin films over a wavelength range of 0.6-12 mum. Results from adhesion, abrasion, and humidity testing have been included to characterize the durability of each film.

Thermal conductivities of thin, sputtered optical films.

The normal component of thin-film thermal conductivity has been measured for the first time, to the best of our knowledge, for several advanced sputtered optical materials. Included are data for single layers of boron nitride, silicon aluminum nitride, silicon aluminum oxynitride, silicon carbide, and for dielectricenhanced metal reflectors of the form Al(SiO(2)/Si(3)N(4))(n) and Al(Al(2)O(3)/AlN)(n). Sputtered films of more conventional materials such as SiO(2), Al(2)O(3), Ta(2)O(5), Ti, and Si have also been measured.

Interference-enhanced Raman scattering from Ti0(2)/Si0(2) multilayers: measurement and theory.

Raman-band intensities for sputter-deposited TiO(2)/SiO(2) multilayer coatings are found to exhibit a strong dependence on excitation wavelength of the probe laser. A model based on standing waves within the stack correctly predicts the magnitude and wavelength dependence of the observed enhancements.