Publications by authors named "Vladimir Enaldiev"

Article Synopsis
  • Twisted two-dimensional (2D) material heterostructures allow researchers to explore unique physical phenomena, especially at small twist angles where crystals rearrange themselves.
  • Understanding these complex materials requires advanced imaging techniques to visualize the local configurations, which can vary due to disorder.
  • The study presents an effective method using electron channeling contrast imaging (ECCI) to non-destructively visualize these domains in twisted transition metal dichalcogenide (TMD) heterostructures, even under encapsulation layers, enhancing insight into their properties.
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Van der Waals heterostructures have opened new opportunities to develop atomically thin (opto)electronic devices with a wide range of functionalities. The recent focus on manipulating the interlayer twist angle has led to the observation of out-of-plane room temperature ferroelectricity in twisted rhombohedral bilayers of transition metal dichalcogenides. Here we explore the switching behaviour of sliding ferroelectricity using scanning probe microscopy domain mapping and tunnelling transport measurements.

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Twisted bilayers of two-dimensional semiconductors offer a versatile platform for engineering quantum states for charge carriers using moiré superlattice effects. Among the systems of recent interest are twistronic MoX/WX heterostructures (X = Se or S), which undergo reconstruction into preferential stacking domains and highly strained domain wall networks, determining the electron/hole localization across moiré superlattices. Here, we present a catalogue of options for the formation of self-organized quantum dots and wires in lattice-reconstructed marginally twisted MoX/WX bilayers with a relative lattice mismatch δ ≪ 1 for twist angles ranging from perfect alignment to θ ∼ 1°.

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Lattice relaxation in twistronic bilayers with close lattice parameters and almost perfect crystallographic alignment of the layers results in the transformation of the moiré pattern into a sequence of preferential stacking domains and domain wall networks. Here, we show that reconstructed moiré superlattices of the perfectly aligned heterobilayers of same chalcogen transition metal dichalcogenides have broken-symmetry structures featuring twisted nodes ("twirls") of domain wall networks. The analysis of twist-angle dependence of strain characteristics for the broken-symmetry structures shows that the formation of twirl reduces the amount of hydrostatic strain around the nodes, potentially weakening their influence on the band edge energies of electrons and holes.

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Semiconducting ferroelectric materials with low energy polarization switching offer a platform for next-generation electronics such as ferroelectric field-effect transistors. Recently discovered interfacial ferroelectricity in bilayers of transition metal dichalcogenide films provides an opportunity to combine the potential of semiconducting ferroelectrics with the design flexibility of 2D material devices. Here, local control of ferroelectric domains in a marginally twisted WS bilayer is demonstrated with a scanning tunneling microscope at room temperature, and their observed reversible evolution is understood using a string-like model of the domain wall network (DWN).

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Ferroelectricity (Valasek, J. 1921, 17, 475), a spontaneous formation of electric polarization, is a solid state phenomenon, usually, associated with ionic compounds or complex materials. Here we show that, atypically for elemental solids, few-layer graphenes can host an equilibrium out-of-plane electric polarization, switchable by sliding the constituent graphene sheets.

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Twisted heterostructures of two-dimensional crystals offer almost unlimited scope for the design of new metamaterials. Here we demonstrate a room temperature ferroelectric semiconductor that is assembled using mono- or few-layer MoS. These van der Waals heterostructures feature broken inversion symmetry, which, together with the asymmetry of atomic arrangement at the interface of two 2D crystals, enables ferroelectric domains with alternating out-of-plane polarization arranged into a twist-controlled network.

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Moiré structures in small-angle-twisted bilayers of two-dimensional (2D) semiconductors with a broken-symmetry interface form arrays of ferroelectric (FE) domains with periodically alternating out-of-plane polarization. Here, we propose a network theory for the tunability of such FE domain structure by applying an electric field perpendicular to the 2D crystal. Using multiscale analysis, we derive a fully parametrized string-theory-like description of the domain wall network (DWN) and show that it undergoes a qualitative change, after the arcs of partial dislocation (PD) like domain walls merge (near the network nodes) into streaks of perfect screw dislocations (PSD), which happens at a threshold displacement field dependent on the DWN period.

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In bilayers of two-dimensional semiconductors with stacking arrangements which lack inversion symmetry charge transfer between the layers due to layer-asymmetric interband hybridisation can generate a potential difference between the layers. We analyse bilayers of transition metal dichalcogenides (TMDs)-in particular, [Formula: see text]-for which we find a substantial stacking-dependent charge transfer, and InSe, for which the charge transfer is found to be negligibly small. The information obtained about TMDs is then used to map potentials generated by the interlayer charge transfer across the moiré superlattice in twistronic bilayers.

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Van der Waals heterostructures form a unique class of layered artificial solids in which physical properties can be manipulated through controlled composition, order and relative rotation of adjacent atomic planes. Here we use atomic-resolution transmission electron microscopy to reveal the lattice reconstruction in twisted bilayers of the transition metal dichalcogenides, MoS and WS. For twisted 3R bilayers, a tessellated pattern of mirror-reflected triangular 3R domains emerges, separated by a network of partial dislocations for twist angles θ < 2°.

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