Publications by authors named "Vladimir Cambel"

We demonstrated numerically the skyrmion formation in ultrathin nanodisks using a magnetic force microscopy tip. We found that the local magnetic field generated by the magnetic tip significantly affects the magnetization state of the nanodisks and leads to the formation of skyrmions. Experimentally, we confirmed the influence of the local field on the magnetization states of the disks.

View Article and Find Full Text PDF

Strong interest in nanomagnetism stems from the promise of high storage densities of information through control of ever smaller and smaller ensembles of spins. There is a broad consensus that the Landau-Lifshitz-Gilbert equation reliably describes the magnetization dynamics on classical phenomenological level. On the other hand, it is not so evident that the magnetization dynamics governed by this equation contains built-in asymmetry in the case of broad topology sets of symmetric total energy functional surfaces.

View Article and Find Full Text PDF

Standard magnetic force microscopy (MFM) is considered as a powerful tool used for magnetic field imaging at nanoscale. The method consists of two passes realized by the magnetic tip. Within the first one, the topography pass, the magnetic tip directly touches the magnetic sample.

View Article and Find Full Text PDF

A novel approach to local anodic oxidation technique, which leads to approximately equal 50 nm wide line patterns, is described. The technique is utilized to prepare quantum point contact on a low-mobility semiconductor heterostructure. Transport measurements show quantized conductance in zero magnetic field at 4.

View Article and Find Full Text PDF

The local anodic oxidation (LAO) by the tip of atomic force microscope (AFM) is used for fabrication of nanometer-scaled structures and devices. We study the technology of LAO applied to semiconductor heterostructures, theoretically and experimentally as well. The goal is to improve the LAO process itself, i.

View Article and Find Full Text PDF

We have experimentally explored a new approach to local anodic oxidation (LAO) of a semiconductor heterostructures by means of atomic force microscopy (AFM). We have applied LAO to an InGaP/AlGaAs/GaAs heterostructure. Although LAO is usually applied to oxidize GaAs/AlGaAs/GaAs-based heterostructures, the use of the InGaP/AlGaAs/GaAs system is more advantageous.

View Article and Find Full Text PDF