Publications by authors named "Vipin N Tondare"

Scanning electron microscopy (SEM) has been frequently used for size and shape measurements of particles. SEM images offer two-dimensional (2D) information about a particle's lateral dimensions. Unfortunately, information about the particle's three-dimensional (3D) size and shape remains unavailable.

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Metal powder particle size distribution (PSD) is a critical factor affecting powder layer density and uniformity in additive manufacturing processes. Among various existing measurement methods, dynamic image analysis (DIA) instruments are very appealing for measuring PSD. However, the 'black box' nature and complex measurement process inherent to DIA make quantification of uncertainty challenging.

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Three-dimensional (3D) reconstruction of a sample surface from scanning electron microscope (SEM) images taken at two perspectives has been known for decades. Nowadays, there exist several commercially available stereophotogrammetry software packages. For testing these software packages, in this study we used Monte Carlo simulated SEM images of virtual samples.

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The morphology of porous silicon is studied by scanning electron microscopy (SEM) by making an oxide replica of the pore structure. Highly branched n-type porous silicon samples were prepared and a replica was formed by oxidation of the pores followed by selective removal of the silicon substrate to expose the oxide pores. Scanning and transmission electron microscopy images confirmed many previously held assumptions about porous silicon formation, including the fractal structure and crystallographic propagation; they also provided a clearer understanding of the details of pore formation.

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