Phosphorene, a single sheet of black phosphorus, is an elemental two-dimensional material with unique properties and potential applications in semiconductor technology. While few-layer flakes of the material have been characterized using transmission electron microscopy, very little is known about its response to electron irradiation, which may be particularly important in the context of top-down engineering of phosphorus nanostructures using a focused electron beam. Here, using first-principles simulations, we study the production of defects in a single phosphorene sheet under impacts of energetic electrons.
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