Optical metasurface technology promises an important potential for replacing bulky traditional optical components, in addition to enabling new compact and lightweight metasurface-based devices. Since even subtle imperfections in metasurface design or manufacture strongly affect their performance, there is an urgent need to develop proper and accurate protocols for their characterization, allowing for efficient control of the fabrication. We present non-destructive spectroscopic Mueller matrix ellipsometry in an uncommon off-specular configuration as a powerful tool for the characterization of orthogonal polarization beam-splitters based on a-Si:H nanopillars.
View Article and Find Full Text PDFPhotocathodes are key elements in high-brightness electron sources and ubiquitous in the operation of large-scale accelerators, although their operation is often limited by their quantum efficiency and lifetime. Here, we propose to overcome these limitations by utilizing direct-laser nanostructuring techniques on copper substrates, improving their efficiency and robustness for next-generation electron photoinjectors. When the surface of a metal is nanoengineered with patterns and particles much smaller than the optical wavelength, it can lead to the excitation of localized surface plasmons that produce hot electrons, ultimately contributing to the overall charge produced.
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