Shot-noise measurements of single-atom junctions using a scanning tunneling microscope.

Current fluctuations related to the discreteness of charge passing through small constrictions are termed shot noise. This unavoidable noise provides both advantages-being a direct measurement of the transmitted particles' charge-and disadvantages-a main noise source in nanoscale devices operating at low temperature. While better understanding of shot noise is desired, the technical difficulties in measuring it result in relatively few experimental works, especially in single-atom structures.