Publications by authors named "Vamsi Talla"

Article Synopsis
  • Precise integration of materials at the nanoscale is crucial for developing advanced electronic and photonic devices.
  • Researchers employed an atomic force microscope (AFM) to create carbon-free silicon (Si), germanium (Ge), and silicon-germanium (SiGe) nanostructures with exact control over their size and shape.
  • The method can be scaled up for larger areas using specialized conducting stamps, and it can be adapted to work with various semiconductor materials by choosing different chemical precursors.
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