Fast numerical Fourier analysis of moiré pattern induced by a periodic metallic array on top of the microscopically patterned red-green-blue light sources.

An accurate and fast moiré pattern analysis algorithm is proposed for a periodic metallic array placed adjacent to a patterned red-green-blue (RGB) light source with a microscopic gap utilizing Fourier transform along with the human eye contrast sensitivity function. We analyzed how the moiré pattern evolved varying tilt angles and metal array periodicities placed on the top of RGB light sources, which have their own spatial periodicities. Based on multiplicative model, moiré patterns were numerically generated and the influences of 70 tilt angles and 60 periodicities on the moiré standard deviation were thoroughly analyzed to minimize moiré visibility.

Binary code DOE optimization for speckle suppression in a laser display.

Using a laser light source in imaging devices provides a wide color gamut, high brightness, resolution, and efficiency. At the same time, it creates a speckle pattern that deteriorates the image quality. This paper is related to the application of the moving binary code diffractive optical element (DOE) for speckle suppression in a laser display.

Experiment evaluation of speckle suppression efficiency of 2D quasi-spiral M-sequence-based diffractive optical element.

The quasi-spiral 2D diffractive optical element (DOE) based on M-sequence of length N=15 is designed and manufactured. The speckle suppression efficiency by the DOE rotation is measured. The speckle suppression coefficients of 10.

Full speckle suppression in laser projectors using two Barker code-type diffractive optical elements.

The mathematical model of a speckle-suppression method based on two Barker code-type diffractive optical elements (DOEs) moving in orthogonal directions is developed. The analytic formulae for speckle suppression efficiency are obtained. The model indicates that the one pair of DOEs can be used for laser beams of different colors.

Line-defect calibration for line-scanning projection display.

A method of line-defect calibration for line-scanning projection display is developed to accomplish acceptable display uniformity. The line scanning display uses a line modulating imaging and scanning device to construct a two-dimensional image. The inherent line-defects in an imaging device and optical lenses are the most fatal performance-degrading factor that should be overcome to reach the basic display uniformity level.