Measurements of surface roughness: use of a CCD camera to correlate doubly scattered speckle patterns.

We describe an instrument, built around a commercial CCD camera and some fast image-processing boards, that evaluates roughness height by measuring the average size of doubly scattered speckle patterns. The device is a variant of a recent proposal that was based on the use of a spatial modulator to perform the Fourier transform of a speckle image. In the present setup, the Fourier transform is replaced by the direct evaluation of a second-order correlation function.