Publications by authors named "V G Pleshchev"

The x-ray diffraction, electrical resistivity and thermal expansion measurements have been employed to study how the intercalation of Cr atoms into TiSe2 matrix affects the crystal structure, formation of the charge density wave (CDW) and electrical properties. The intercalation of a small amount of Cr atoms (up to x ~ 0.03) is observed to suppress the CDW formation.

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Crystal structure investigations, electrical resistivity, and magnetic measurements have been performed for polycrystalline samples of intercalated compounds Cr(x)TiTe(2) with a Cr concentration up to x = 0.65. According to the room-temperature x-ray diffraction study of Cr(x)TiTe(2), the initial hexagonal crystal structure transforms to a monoclinic one with increasing Cr content up to x≥0.

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