Error propagation in differential phase evaluation.

In many metrological applications the data being measured is associated to the phase difference codified in two fringe patterns. This phase difference can be recovered directly with what are called Differential Phase Shifting Algorithms (DPSAs) by using a combination of irradiance values from both patterns in the arctangent argument. Use of such algorithms requires characterisation mechanisms to inform of their sensitivity to the various random and systematic error sources, which is the same as for well-studied Phase Shifting Algorithms (PSAs).

In situ roughness measurements for the solar cell industry using an atomic force microscope.

Areal roughness parameters always need to be under control in the thin film solar cell industry because of their close relationship with the electrical efficiency of the cells. In this work, these parameters are evaluated for measurements carried out in a typical fabrication area for this industry. Measurements are made using a portable atomic force microscope on the CNC diamond cutting machine where an initial sample of transparent conductive oxide is cut into four pieces.