An oxide-based resistance memory is a leading candidate to replace Si-based flash memory as it meets the emerging specifications for future memory devices. The non-uniformity in the key switching parameters and low endurance in conventional resistance memory devices are preventing its practical application. Here, a novel strategy to overcome the aforementioned challenges has been unveiled by tuning the growth direction of epitaxial brownmillerite SrFeO thin films along the SrTiO [111] direction so that the oxygen vacancy channels can connect both the top and bottom electrodes rather directly.
View Article and Find Full Text PDFNanoscale Res Lett
December 2017
Oxygen vacancies have a profound effect on the magnetic, electronic, and transport properties of transition metal oxide materials. Here, we studied the influence of oxygen vacancies on the magnetoresistance (MR) properties of SrRu Fe O epitaxial thin films (x = 0.10, 0.
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