X-ray production cross sections for Ir and Bi M-subshells induced by electron impact.

M-subshell X-ray production cross sections were indirectly measured for Ir and Bi targets irradiated with monoenergetic electron beams. The projectile energy range ran from 2.2 to 28 keV, impinging on Ir and Bi pure bulk targets in a scanning electron microscope.

L-shell ionization of Cd: Structure of the x-ray emission spectrum.

The cadmium L x-ray spectrum induced by electron impact was analyzed in detail. The measurements were performed on a bulk pure sample using a commercial wavelength dispersive spectrometer, and the spectrum was processed with a parameter optimization method previously developed. This procedure permitted the determination of characteristic energies, relative transition probabilities and natural linewidths for this element.

Effects of the carbon coating and the surface oxide layer in electron probe microanalysis.

Effects related with the attenuation and deflection suffered by an electron beam when it passes through a carbon conductive coating and an oxide film layer on the surface of bulk samples are studied by Monte Carlo simulations and energy dispersive spectroscopy with electron excitation. Analytical expressions are provided for the primary beam energy and intensity losses and for the deflection of the incident electrons in both layers, in terms of the incidence energy, the film mass thicknesses, and the atomic number of the oxidized element. From these analytical expressions, suitable corrections are proposed for the models used to describe the X-ray spectrum of the substrate, including also the contribution of the X-rays generated in the oxide and conductive films and the characteristic X-ray absorption occurring in those layers.

Characterization of atmospheric particles by electron probe X-ray microanalysis.

Microchemical glass standards were used to validate a quantitation method based on peak-to-background (P/B) ratios from electron probe x-ray microanalysis spectra. This standardless method was applied to the determination of concentrations of individual particles from Malpha or Lalpha lines, as well as from Kalpha lines. The algorithm was tested on particulate glass samples for diameters ranging from 1 to 20 microm.