Development of a variable-wavelength optical rotation detector in the ultraviolet region.

A new type of optical rotation (OR) detector based on the phase retardation of the first-order diffraction beam has been constructed. The proposed detector responded to only OR properties by eliminating the circular dichroism (CD) effect. Thus, it could measure the optical rotatory dispersion curves in the Cotton band.

Compact ellipsometer employing a static polarimeter module with arrayed polarizer and wave-plate elements.

A portable ellipsometer with a compact static polarimeter using an arrayed polarizer, an arrayed wave plate, and a CCD image sensor is developed. A high level of repeatability at a measurement speed of 0.3 s is demonstrated by measurement of SiO(2) films ranging from 2 to 300 nm in thickness deposited on an Si wafer.