Publications by authors named "Tonglu Xing"

A three-dimensional polarimetric ptychography (3D-PP) technique is proposed to reconstruct the residual stress distribution in optical elements in three dimensions by combining polarization imaging and a 3D ptychographic iterative engine (3D-PIE). 3D-PP mainly uses two orthogonal linear polarizers placed along the light direction to capture the photoelastic information within an optical element. Based on phase shift theory, a three-step phase shift method is proposed to record three dark field images, allowing for calculating the isometric line of residual stress within the optical element.

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We propose a three-wavelength elliptically polarized light photoelasticity method for high efficiency and low-cost stress measurement. By illuminating the sample with two different forms of elliptically polarized light for each wavelength sources, twelve images are acquired. From these images, phase delay and the principal internal stress difference are precisely computed using developed algorithms.

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A device incorporating a series of periscope-like waveguides to achieve bidirectional focusing and plasmon launching is proposed. Optimizing the number, positions, and dimensions of the waveguides and tuning the waveguide optical paths both produce the required phase shifts to shape wavefronts and achieve constructive interference at the desired points. Due to the symmetry and reversibility of the structure, the lens can focus the light incident on both sides.

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