Publications by authors named "Tomislav Kremer"

A broad family of the nowadays studied low-dimensional systems, including 2D materials, demonstrate many fascinating properties, which however depend on the atomic composition as well as on the system dimensionality. Therefore, the studies of the electronic correlation effects in the new 2D materials is of paramount importance for the understanding of their transport, optical and catalytic properties. Here, by means of electron spectroscopy methods in combination with density functional theory calculations we investigate the electronic structure of a new layered van der Waals [Formula: see text] (X: S, Se) materials.

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Direct force measurements between negatively charged silica particles in the presence of a like-charged strong polyelectrolyte were carried out with an atomic force microscope. The force profiles can be quantitatively interpreted as a superposition of depletion and double-layer forces. The depletion forces are modeled with a damped oscillatory profile, while the double-layer forces with the mean-field Poisson-Boltzmann theory for a strongly asymmetric electrolyte, whereby an effective valence must be assigned to the polyelectrolyte.

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