Chemical-state analysis of organic semiconductors using soft X-ray absorption spectroscopy combined with first-principles calculation.

The chemical states of organic semiconductors were investigated by total-electron-yield soft X-ray absorption spectroscopy (TEY-XAS) and first-principles calculations. The organic semiconductors, pentacene (C(22)H(14)) and pentacenequinone (C(22)H(12)O(2)), were subjected to TEY-XAS and the experimental spectra obtained were compared with the 1s core-level excited spectra of C and O atoms, calculated by a first-principles planewave pseudopotential method. Excellent agreement between the measured and the calculated spectra were obtained for both materials.

Chemical effects in high-resolution nickel Kalpha X-ray fluorescence spectra.

The nickel Kalpha spectra of oxides, halides (NiF2, K2NiF6, NiCl2, NiBr2), complex compounds, and metal are measured with two different double-crystal X-ray fluorescence spectrometers. The peak shifts and line width changes due to the changes in the chemical states are reported. High reproducibility has been shown for the chemical shift and line width measurements.

Valence determination of manganese in battery cathode materials by high-resolution Mn Kalpha1 spectra.

High-resolution the Mn Kalpha1 X-ray fluorescence spectra (HRXRF) were measured for a variety of manganese compounds, the oxidation number (valence) of which was from II to VII. Plots of the valence against the full width at half maximum (FWHM) and the chemical shift of the Kalpha1 X-ray fluorescence spectra give a curve and a liniar relation, respectively. The coefficient of correlation (R2) for the latter plot was 0.