Publications by authors named "Todd V Small"

In this work, a CCD-augmented complete angle scatter instrument (CASI) with a visible red laser source was used to measure the BRDF of a commercially available solar cell designed for small satellites, simultaneously capturing both in-plane and out-of-plane data with high angular resolution surrounding the specular direction. The measurements exhibited three distinct scatter features: a central specular peak, an offset specular peak, and a diffraction pattern. The two peaks were caused by different material surfaces with slightly different normal directions, and the diffraction pattern arose from periodically-spaced metal conducting bars running in one direction across the solar cell surface.

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