Publications by authors named "Tobias Schmid-Schirling"

Conventional microscopes have a high spatial resolution and a low depth-of-field. Light field microscopes have a high depth-of-field but low spatial resolution. A new hybrid approach uses information from both systems to reconstruct a high-resolution light field [Appl.

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Anomaly detection is a critical problem in the manufacturing industry. In many applications, images of objects to be analyzed are captured from multiple perspectives which can be exploited to improve the robustness of anomaly detection. In this work, we build upon the deep support vector data description algorithm and address multi-perspective anomaly detection using three different fusion techniques, i.

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