Test Rig for Investigating the Functional and Structural Fatigue of Shape Memory Alloy Wires Based on Different Activation Profiles.

This work presents a test rig developed for testing the lifetime of electrically and cyclically activated shape memory alloy wires. This test rig is developed to provide information on the functional and structural fatigue of the wires. Therefore, electrical activation on the test rig can be carried out using different activation profiles, because it is of great research interest to determine whether those profiles have a significant influence on the wire's lifetime and functional behavior.