We demonstrate the controlled growth of Bi(110) and Bi(111) films on an α-AlO(0001) substrate by surface x-ray diffraction and x-ray reflectivity using synchrotron radiation. At temperatures as low as 40 K, unanticipated pseudo-cubic Bi(110) films are grown with thicknesses ranging from a few to tens of nanometers. The roughness at the film-vacuum as well as the film-substrate interface, can be reduced by mild heating, where a crystallographic orientation transition of Bi(110) towards Bi(111) is observed at 400 K.
View Article and Find Full Text PDFThe quantum-size effect (QSE) driven growth of Bi film structures on Ni(111) was studied in situ using low energy electron microscopy and selective area low energy electron diffraction (μLEED). Domains with a (3×3), [(3)(1)(-1)(2)], and (7×7) film structure are found with a height of 3, 5, and 7 atomic layers, respectively. A comparison of I/V-μLEED curves with tensor LEED calculations shows perfectly accommodated Fermi wavelengths, indicative that not only the quantized height, but also the film structure is driven by QSE.
View Article and Find Full Text PDFWith their low surface free energy, lead films tend to wet surfaces. However, quantum size effects (QSE) often lead to islands with distinct preferred heights. We study thin lead films on Ni(111) using low energy electron microscopy and selected area low energy electron diffraction.
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