Visualization of magnetic domains by near-field scanning microwave microscope.

A near-field scanning microwave microscope (NSMM) system was used for the investigation of magnetic properties of a hard disk (HD) under an external magnetic field. To demonstrate local microwave characterization of magnetic domains by NSMM, we scanned the HD surface by measuring the microwave reflection coefficient S(11) of the NSMM at an operating frequency near 4.4GHz.

Investigation of CdS thin films by a near-field microwave microprobe.

Cadmium sulphide (CdS) thin films with different microstructures and morphologies were measured by using a near-field microwave microprobe (NFMM). The NFMM system was coupled to a dielectric resonator with a distance regulation system at an operating frequency f=4.1 GHz.

Characterization of Alq3 thin films by a near-field microwave microprobe.

We observed tris-8-hydroxyquinoline aluminum (Alq3) thin films dependence on substrate heating temperatures by using a near-field microwave microprobe (NFMM) and by optical absorption at wavelengths between 200 and 900 nm. The changes of absorption intensity at different substrate heating temperatures are correlated to the changes in the sheet resistance of Alq3 thin films.

Characterization of magnetic materials using a scanning microwave microprobe.

We investigated the electromagnetic properties of metals of iron, nickel, cobalt, aluminum, gold, copper, silver, and permalloy thin films on SiO2 substrates using a near-field microwave microprobe. The electromagnetic properties of metal sheets were estimated by measuring the microwave reflection coefficient S(11) and compared with the theoretical values. We observed the hysteresis behavior of permalloy thin films on SiO2 substrates using a near-field scanning microwave microprobes (NSMM) system.