Active thermo-reflectometry for absolute temperature measurement by infrared thermography on specular materials.

Knowledge of material emissivity maps and their true temperatures is of great interest for contactless process monitoring and control with infrared cameras when strong heat transfer and temperature change are involved. This approach is always followed by emissivity or reflections issues. In this work, we describe the development of a contactless infrared imaging technique based on the pyro-reflectometry approach and a specular model of the material reflection in order to overcome emissivities and reflections problems.