Soft X-ray wavefront sensing at an ellipsoidal mirror shell.

A reliable `in situ' method for wavefront sensing in the soft X-ray domain is reported, developed for the characterization of rotationally symmetric optical elements, like an ellipsoidal mirror shell. In a laboratory setup, the mirror sample is irradiated by an electron-excited (4.4 keV), micrometre-sized (∼2 µm) fluorescence source (carbon K, 277 eV).

Versatile tabletop setup for picosecond time-resolved resonant soft-x-ray scattering and spectroscopy.

We present a laser-driven, bright, and broadband (50 to 1500 eV) soft-x-ray plasma source with <10 ps pulse duration. This source is employed in two complementary, laboratory-scale beamlines for time-resolved, magnetic resonant scattering and spectroscopy, as well as near-edge x-ray absorption fine-structure (NEXAFS) spectroscopy. In both beamlines, dedicated reflection zone plates (RZPs) are used as single optical elements to capture, disperse, and focus the soft x rays, reaching resolving powers up to E/ΔE > 1000, with hybrid RZPs at the NEXAFS beamline retaining a consistent E/ΔE > 500 throughout the full spectral range, allowing for time-efficient data acquisition.

Towards Understanding Excited-State Properties of Organic Molecules Using Time-Resolved Soft X-ray Absorption Spectroscopy.

The extension of the pump-probe approach known from UV/VIS spectroscopy to very short wavelengths together with advanced simulation techniques allows a detailed analysis of excited-state dynamics in organic molecules or biomolecular structures on a nanosecond to femtosecond time level. Optical pump soft X-ray probe spectroscopy is a relatively new approach to detect and characterize optically dark states in organic molecules, exciton dynamics or transient ligand-to-metal charge transfer states. In this paper, we describe two experimental setups for transient soft X-ray absorption spectroscopy based on an LPP emitting picosecond and sub-nanosecond soft X-ray pulses in the photon energy range between 50 and 1500 eV.

Conception of diffractive wavefront correction for XUV and soft x-ray spectroscopy.

We present a simple and precise method to minimize aberrations of mirror-based, wavelength-dispersive spectrometers for the extreme ultraviolet (XUV) and soft x-ray domain. The concept enables an enhanced resolving power $ E/\Delta E $E/ΔE, in particular, close to the diffraction limit over a spectral band of a few percent around the design energy of the instrument. Our optical element, the "diffractive wavefront corrector" (DWC), is individually shaped to the form and figure error of the mirror profile and might be written directly with a laser on a plane and even strongly curved substrates.

Trevor Hicks and solid state neutron optics.

Following an idea of Trevor Hicks we built neutron polarizing benders with silicon wafers forming the bender channels. In the last decade a variety of neutron optical devices based on this idea were realized such as collimators with absorbing as well as reflecting walls, radial benders and collimators and focusing devices which are all much shorter than their classical counterparts. Their development will be reviewed here.