Developing an in situ environmental TEM set up for investigations of resistive switching mechanisms in Pt-PrCaMnO-Pt sandwich structures.

Non-volatile resistance change under electric stimulation in many metal-oxides is a promising path to next generation memory devices. However, the underlying mechanisms are still not fully understood. In situ transmission electron microscopy experiments provide a powerful tool to elucidate these mechanisms.

Charge attachment induced transport - bulk and grain boundary diffusion of potassium in PrMnO.

The transport of potassium through praseodymium-manganese oxide (PrMnO; PMO) has been investigated by means of the charge attachment induced transport (CAIT) technique. To this end, potassium ions have been attached to the front side of a 250 nm thick sample of PMO. The majority of the potassium ions become neutralized at the surface of the PMO, while some of the potassium ions diffuse through.