A New Simple Analytical Method for a Highly Accurate Determination of the Optical Parameters of a Slab from Transmittance Data.

To date, determining with high accuracy the optical parameters (extinction coefficient and refractive index ) of a slab from the sole transmittance data requires an inverse method based on numerical iteration procedures. In this paper, we propose a new inverse analytical method of extracting (, ) without numerical iterative processes. The high accuracy of this new inverse method is assessed, and as an application example, the optical parameters of CaF and Si substrates are determined in the IR spectral range of 4-8 µm.