Ni-CeO spherical nanostructures for magnetic and electrochemical supercapacitor applications.

The synthesis of nanoparticles has great control over the structural and functional characteristics of materials. In this study, CeO and Ni-CeO spherical nanoparticles were prepared using a microwave-assisted method. The prepared nanoparticles were characterized via thermogravimetry, X-ray diffraction (XRD), Raman, FTIR, scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), vibrating sample magnetometry (VSM) and cyclic voltammetry (CV).

Synthesis, structural, spectroscopic and optical studies of charge transfer complex salts.

New charge transfer molecular complex adducts of picric acid (C6H3N3O7) with triethylamine (C6H15N) and dimethylformamide (HCON(CH3)2) were synthesized successfully for the first time. Chemical composition and stoichiometry of the synthesized complex salts were verified by CHN elemental analysis. Solubility of the complex salts have been determined by gravimetric method and single crystals of two new salts were grown by low temperature solution growth technique.

Controlled synthesis, optical and electronic properties of Eu3+ doped yttrium oxysulfide (Y2O2S) nanostructures.

Single crystalline Eu(3+) doped yttrium oxysulfide (Y(2)O(2)S) nanocrystals, nanosheets, nanobelts, nanotubes, nanorods and nanowires have been successfully prepared via precursors of Y(OH)(3) nanostructures in high yields and purities by a convenient hydrothermal method under mild conditions. Comprehensive structural, morphological and spectroscopical studies have been carried out on the nanometre scale. The as-prepared samples are characterized using X-ray photoelectron spectra (XPS), to investigate the elementary states on the surfaces.

Optimization of growth conditions of ZnO nano thin films by chemical double dip technique.

Zinc oxide (ZnO) nano thin films have been deposited by the chemical double-dip technique using aqueous ZnSO and NaOH solutions. The ZnO films were characterized in terms of surface morphology by x-ray diffraction, energy-dispersive x-ray analysis (EDX), the use of a scanning electron microscope (SEM) and atomic force microscope (AFM) for surface morphology. The films exhibited a smooth morphology.