Parametric downconversion driven by modern, high-power sources of 10-fs-scale near-infrared pulses, in particular intrapulse difference-frequency generation (IPDFG), affords combinations of properties desirable for molecular vibrational spectroscopy in the mid-infrared range: broad spectral coverage, high brilliance, and spatial and temporal coherence. Yet, unifying these in a robust and compact radiation source has remained a key challenge. Here, we address this need by employing IPDFG in a multi-crystal in-line geometry, driven by the 100-W-level, 10.
View Article and Find Full Text PDFA post-production characterization approach based on spectral photometric and ellipsometric data related to a specially prepared set of samples is proposed. Single-layer (SL) and multilayer (ML) sets of samples presenting building blocks of the final sample were measured ex-situ, and reliable thicknesses and refractive indices of the final ML were determined. Different characterization strategies based on ex-situ measurements of the final ML sample were tried, reliability of their results was compared, and the best characterization approach for practical use, when preparation of the mentioned set of samples would be a luxury, is proposed.
View Article and Find Full Text PDFHigh group delay dispersion (GDD) is often required for ultrafast laser applications. To achieve GDD level higher than -10000 fs in a single mirror setting is difficult due to the high sensitivity to unavoidable production inaccuracies. To overcome the problem, total internal reflection (TIR) based dispersive mirrors have been proposed in theory.
View Article and Find Full Text PDFThin films of Ge, ZnS, , and produced using e-beam evaporation on ZnSe and Ge substrates were characterized in the range of 0.4-12 µm. It was found that the Sellmeier model provides the best fit for refractive indices of ZnSe substrate, ZnS, and films; the Cauchy model provides the best fit for film.
View Article and Find Full Text PDFThe proper functioning of living systems and physiological phenotypes depends on molecular composition. Yet simultaneous quantitative detection of a wide variety of molecules remains a challenge. Here we show how broadband optical coherence opens up opportunities for fingerprinting complex molecular ensembles in their natural environment.
View Article and Find Full Text PDFComplementary pair of dispersive multilayers operating in the 2-4 µm spectral range were designed and produced for the first time. The mirrors comprise layers of Si and SiO thin-film materials. The pair exhibits unparalleled reflectance exceeding 99.
View Article and Find Full Text PDFBroadband dispersive mirrors operating in the mid-infrared spectral range of 6.5-11.5 μm are developed for the first time, to the best of our knowledge.
View Article and Find Full Text PDFA gold-coated silicon grating has been developed, enabling efficient spatial separation of broadband mid-infrared (MIR) beams with wavelengths >5 μm from collinearly propagating, broadband, high-power light in the near-infrared (NIR) spectral range (centered at 2 μm). The optic provides spectral filtering at high powers in a thermally robust and chromatic-dispersion-free manner such as that necessary for coherent MIR radiation sources based on parametric frequency downconversion of femtosecond NIR lasers. The suppression of a >20 W average-power, 2 μm driving pulse train by three orders of magnitude, while retaining high reflectivity of the broadband MIR beam, is presented.
View Article and Find Full Text PDFTwo beamsplitters operating across the near-infrared (770-1050 nm) and mid-infrared (4-8 µm) spectral ranges are developed. For the first time, the beamsplitters based on thin-film materials combinations of ZnS/YbF and Ge/YbF are investigated. The multilayers operate at the Brewster angle of ZnSe substrate.
View Article and Find Full Text PDFDispersive mirrors operating in a broadband infrared spectral range are reported for the first time. The mirrors are based on Si/SiO thin-film materials. The coatings exhibit reflectance exceeding 99.
View Article and Find Full Text PDFDielectric multilayer coatings exhibiting steep reflectance in an extremely narrow transition zone, highly sensitive to any variations of layer refractive indices and therefore suitable for studying the nonlinear properties are produced and characterized. Increase of reflectance at growing intensity reveals the presence of the optical Kerr effect. A new method calculating intensity dependent spectral characteristics of multilayer optical coatings in the case of nonlinear interaction with high intensity laser pulses is developed.
View Article and Find Full Text PDFWe report a challenging design, fabrication and post-production characterization problem of a dispersive mirror supporting the spectral range from 2000 nm to 2200 nm and providing a group delay dispersion of -1000 fs. The absolute reflectance in the working range is over 99.95%.
View Article and Find Full Text PDFWe report the utilization of the optical Kerr effect in multilayer dielectric coatings, previously discussed only theoretically. We present the design and realization of multilayer dielectric optical structures with layer-specific Kerr nonlinearities, which permit tailoring of the intensity-dependent effects. The modulation depth in reflectance reaches up to 6% for the demonstrated examples of dielectric nonlinear multilayer coatings.
View Article and Find Full Text PDFWe report on design, production and characterization of an extremely broadband multilayer beamsplitter, covering wavelength range from 0.67 - 2.6 µm.
View Article and Find Full Text PDFA highly-dispersive mirror with the unprecedented group delay dispersion of -10000 fs in the wavelength range of 1025-1035 nm is reported. Reproducible production of a coating with such a high dispersion was possible due to the recently developed robust synthesis technique. Successful employment of the new highly-dispersive mirror in an oscillator is demonstrated.
View Article and Find Full Text PDFEach complicated coating, in particular, a dispersive mirror consists of dozens of layers. Thin films layers have mechanical stresses. After summing up stresses from all layers, the resulting stress is high enough to bend even a relatively thick substrate.
View Article and Find Full Text PDFThe electronic and optical properties of TiO2 atomic structures representing simulated thin films have been investigated using density functional theory. Suitable model parameters and system sizes have been identified in advance by validation of the results with experimental data. Dependencies of the electronic band gap and the refractive index have been calculated as a function of film density.
View Article and Find Full Text PDFWe demonstrate selection of reliable approaches for post-production characterization of oblique incidence multilayer optical coatings. The approaches include choice of input information, selection of adequate coating model, corresponding numerical characterization algorithm, and verification of the results. Applications of the approaches are illustrated with post-production characterization of oblique incidence edge filter, oblique incidence beam splitter and oblique incidence 43-layer quarter-wave mirror.
View Article and Find Full Text PDFPeriodic multilayer structures of quarterwave and multiple quarterwave stacks with shifted ratios of high and low index layers in the half-wave pairs are considered. Analytical dependencies of the reference wavelength reflectance and the width of high reflectance zone on the number of layers, fraction quarterwave and layer refractive indices are obtained. The structures are used as starting designs for notch filters.
View Article and Find Full Text PDFApplications of computational manufacturing experiments (CMEs) for selection of the most manufacturable designs among a variety of different design solutions are demonstrated. We compare design solutions with respect to estimations of their production yields. Computational experiments are performed using two simulation software tools.
View Article and Find Full Text PDFWe propose a general approach that allows one to reveal factors causing production errors in the course of the deposition process controlled by broadband optical monitoring. We consider computational experiments simulating the real deposition process as a crucial point of this approach. We demonstrate application of the approach using multiple experimental deposition runs of the selected multilayer coatings.
View Article and Find Full Text PDFDetermination of actual parameters of manufactured optical coatings (reverse engineering of optical coatings) provides feedback to the design-production chain and thus plays an important role in raising the quality of optical coatings production. In this paper, the reliability of reverse engineering results obtained using different types of experimental data is investigated. Considered experimental data include offline normal incidence transmittance data, offline ellipsometric data, and online transmittance monitoring data recorded during depositions of all coating layers.
View Article and Find Full Text PDFWe explain reasons of oscillations frequently observed in total losses spectra (1 - R - T) calculated on the basis of measurement spectral photometric data of thin film samples. The first reason of oscillations is related to difference in angles of incidence at which spectral transmittance and reflectance are measured. The second reason is an absorption in a thin film.
View Article and Find Full Text PDFOptical properties of metal island films (MIFs) can be combined with interference of dielectric coatings. A set of multilayer designs containing metal clusters reflecting different colours from front and back side of the coating was obtained by numerical optimization. The chosen designs presenting the range of feasible colours were deposited by electron beam evaporation.
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