Dielectric response of high- hafnium oxide under finite electric field: nonlinearities from and experimental points of view.

Herein, we report on the dielectric-voltage nonlinearities under a constant electric field in metal insulator metal (MIM) capacitor-based hafnium oxide (HfO) with respect to the frequency range. the Schottky emission mechanism obtained from the current-voltage characteristic (-), we calculated the optical dielectric constant for different external DC bias values. The extracted revealed a quadratic dependence on the applied external field.