The effect of crystal grain size on the thermoelectric properties of nanocrystalline antimony telluride (SbTe) thin films was investigated by experiments and first-principles studies using a developed relaxation time approximation. The SbTe thin films were deposited on glass substrates using radio-frequency magnetron sputtering. To change the crystal grain size of the SbTe thin films, thermal annealing was performed at different temperatures.
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