Publications by authors named "Takuhiro Fujiie"

This study entailed the successful deployment of a novel neutron interferometer that utilizes multilayer mirrors. The apparatus facilitates a precise evaluation of the wavelength dependence of interference fringes utilizing a pulsed neutron source. Our interferometer achieved an impressive precision of 0.

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Structure factors describe how incident radiation is scattered from materials such as silicon and germanium and characterize the physical interaction between the material and scattered particles. We used neutron Pendellösung interferometry to make precision measurements of the (220) and (400) neutron-silicon structure factors and achieved a factor-of-four improvement in the (111) structure factor uncertainty. These data provide measurements of the silicon Debye-Waller factor at room temperature and the mean square neutron charge radius square femtometers.

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