Response to "Comment on 'Spin- and angle-resolved inverse photoemission setup with spin orientation independent from electron incidence angle'" [Rev. Sci. Instrum. 93, 093904 (2022)].

We reply to the Comment by Donath et al. on our setup, which allows a total 3D control of the polarization direction of the electron beam in an inverse photoemission spectroscopy (IPES) experiment, a significant advance with respect to previous setups with partial polarization control. Donath et al.

Spin- and angle-resolved inverse photoemission setup with spin orientation independent from electron incidence angle.

A new spin- and angle-resolved inverse photoemission setup with a low-energy electron source is presented. The spin-polarized electron source, with a compact design, can decouple the spin polarization vector from the electron beam propagation vector, allowing one to explore any spin orientation at any wavevector in angle-resolved inverse photoemission. The beam polarization can be tuned to any preferred direction with a shielded electron optical system, preserving the parallel beam condition.

A cartridge-based turning specimen holder with wireless tilt angle measurement for magnetic induction mapping in the transmission electron microscope.

Magnetic induction mapping in the transmission electron microscope using phase contrast techniques such as off-axis electron holography and differential phase contrast imaging often requires the separation of the magnetic contribution to the recorded signal from the electrostatic contribution. When using off-axis electron holography, one of the experimental approaches that can be used to achieve this separation is to evaluate half of the difference between phase shift images that have been recorded before and after turning the sample over. Here, we introduce a cartridge-based sample mounting system, which is based on an existing on-axis tomography specimen holder and can be used to turn a sample over inside the electron microscope, thereby avoiding the need to remove the holder from the microscope to turn the sample over manually.

Pulsed electron gun for electron diffraction at surfaces with femtosecond temporal resolution and high coherence length.

We present a newly designed 30 kV pulsed electron gun for ultrafast electron diffraction suited for pump-probe setups driven by femtosecond laser pulses. The electron gun can be operated both in transmission and reflection geometry. A robust design with a back illuminated Au photocathode, extraction fields of 7.