Electrogravimetry and Structural Properties of Thin Silicon Layers Deposited in Sulfolane and Ionic Liquid Electrolytes.

Potentiostatic deposition of silicon is performed in sulfolane (SL) and ionic liquid (IL) electrolytes. Electrochemical quartz crystal microbalance with damping monitoring (EQCM-D) is used as main analytical tool for the characterization of the reduction process. The apparent molar mass () is applied for estimation of the layer contamination.

Microgravimetric and Spectroscopic Analysis of Solid-Electrolyte Interphase Formation in Presence of Additives.

Electrochemical quartz crystal microbalance (EQCM) with damping monitoring is applied for real-time analysis of solid-electrolyte interphase (SEI) formation in diphenyl octyl phosphate (DPOP) and vinylene carbonate (VC) modified electrolytes. Fast SEI formation is observed for the DPOP containing electrolyte, whereas slow growth is detected in VC-modified and reference electrolytes. QCM measurements in a dry state show considerable reduction of the mass quantity for DPOP and reference samples and minor mass decrease for the SEI layer formed in the presence of VC.