Experimental characterization of bending effects for solid and hollow dielectric waveguides at V-band.

Mm-wave dielectric waveguides are a promising and low-cost technology for the transmission of ultra-high data rates. Besides the attenuation (losses) and group delay, the bending loss of the dielectric waveguides is also one of the key parameters to establish the capacity and energy efficiency of such wired links, when deployed in realistic scenarios. In this context, we report the experimental characterizations of bending effects for various solid and hollow commercially available dielectric waveguides at V-band (50-75 GHz).