The blur caused by the nonzero mean free path of electrons in photoresists exposed by extreme ultraviolet lithography has detrimental consequences on patterning resolution, but its effect is difficult to quantify experimentally. So far, most mean free path calculations use the dielectric formalism, which is an approximation valid in the optical limit and fails at low kinetic energy. In this work, we used a modified substrate-overlayer technique that exploited the attenuation of the Si 2p core level originating specifically from the native silicon dioxide to evaluate the attenuation of electrons traveling through 2 and 4 nm of photoresist overlayers to provide a close estimation of the inelastic mean free path relevant for photoresist lithography patterning and for electron microscopy.
View Article and Find Full Text PDFThe absorption of extreme ultraviolet (EUV) radiation by a photoresist strongly depends on its atomic composition. Consequently, elements with a high EUV absorption cross section can assist in meeting the demand for higher photon absorbance by the photoresist to improve the sensitivity and reduce the photon shot noise induced roughness. In this work, we enhanced the EUV absorption of the methacrylic acid ligands of Zn oxoclusters by introducing fluorine atoms.
View Article and Find Full Text PDFMultilayer beamsplitter polarizers have been developed for improved solar polarimetry at key spectral lines. The advantage of beamsplitter polarizers is that a single device separates s from p polarization; this helps minimize attenuation and enables a more compact and lighter polarimeter, which is important for space instruments. Polarizers based on Al/AlF multilayers were prepared for both C IV (155 nm) and Mg II (280 nm) lines, and based on Al/MgF multilayers for H Lyman α line (121.
View Article and Find Full Text PDFThe Kossel effect is the diffraction by a periodically structured medium, of the characteristic X-ray radiation emitted by the atoms of the medium. We show that multilayers designed for X-ray optics applications are convenient periodic systems to use in order to produce the Kossel effect, modulating the intensity emitted by the sample in a narrow angular range defined by the Bragg angle. We also show that excitation can be done by using photons (X-rays), electrons or protons (or charged particles), under near normal or grazing incident geometries, which makes the method relatively easy to implement.
View Article and Find Full Text PDFWe propose a new model enabling the extraction of the phase of a multilayer mirror from photocurrent measurements in the soft x rays. In this range, the effects of the mean free path of the electrons inside the stack can no longer be neglected, which prevents the phase reconstruction by conventional photocurrent measurements. The new model takes into account this phenomenon and thus extends up to the x rays the applicability range of the technique.
View Article and Find Full Text PDFThe low expected absorption of Ca in the extreme ultraviolet (EUV) makes it an attractive material for multilayers and filters because most materials in nature strongly absorb the EUV. Few optical constant data had been reported for Ca. In this research, Ca films of various thicknesses were deposited on grid-supported C films and their transmittance measured in situ from the visible to the soft x-rays.
View Article and Find Full Text PDFThe localized surface plasmon resonance of metal nanoparticles allows confining the eletromagnetic field in nanosized volumes, creating high-field "hot spots", most useful for enhanced nonlinear optical spectroscopies. The commonly employed metals, Au and Ag, yield plasmon resonances only spanning the visible/near-infrared range. Stretching upward, the useful energy range of plasmonics requires exploiting different materials.
View Article and Find Full Text PDFSmall aluminum nanoparticles have the potential to exhibit localized surface plasmon resonances in the deep ultraviolet region of the electromagnetic spectrum, however technical and scientific challenges make it difficult to attain this limit. We report the fabrication of arrays of Al/Al2O3 core/shell nanoparticles with a metallic-core diameter between 12 and 25 nm that display sharp plasmonic resonances at very high energies, up to 5.8 eV (down to λ = 215 nm).
View Article and Find Full Text PDFPhys Rev E Stat Nonlin Soft Matter Phys
August 2011
Atomic force microscopy (AFM) of cadmium stearate (CdSt) and cobalt stearate (CoSt) Langmuir-Blodgett films show differences in their in-plane morphologies. CdSt films, with a huge number of in-plane "pinhole" defects, follow self-affine behavior, whereas CoSt films, which are almost void of such in-plane defects, show deviation from self-affinity especially at small length scales, suggesting liquidlike behavior, imparting flexibility to the system, in plane. Phase images of CoSt obtained from tapping mode AFM show gentle undulations or hemispherelike features in contrast to its smooth topography, unlike the CdSt system where both height and phase images show self-affine domains.
View Article and Find Full Text PDFThe optical constants of erbium (Er) films were obtained in the 3.25-1580 eV range from transmittance measurements performed at room temperature. Thin films of Er were deposited by evaporation in ultra high vacuum conditions and their transmittance was measured in situ.
View Article and Find Full Text PDFWe report a study of the self-assembly of 1,4-benzenedimethanethiol monolayers on gold formed in n-hexane solution held at 60 °C for 30 min and in dark conditions. The valence band characteristics, the thickness of the layer, and the orientation of the molecules were analyzed at a synchrotron using high resolution photoelectron spectroscopy and near edge X-ray adsorption spectroscopy. These measurements unambiguously attest the formation of a single layer with molecules arranged in the upright position and presenting a free -SH group at the outer interface.
View Article and Find Full Text PDFAtomic force microscopy and X-ray reflectivity studies of cobalt stearate Langmuir-Blodgett (LB) films (CoStp) deposited from a preformed bulk sample on quartz substrates showed formation of a Volmer-Weber type monolayer but no multilayers as compared to the excellent multilayers of cobalt stearate films (CoStn) deposited at the air/water interface by the usual LB technique, in spite of both showing bidentate bridging type coordination of cobalt ions with the carboxylate group. The difference is attributed to existence of different headgroup conformers, observed from Fourier transform infrared (FTIR) studies. The CoStp films had a higher energy 'boat' conformation with linear O-Co-O linkage, whereas CoStn formed a low energy conformer with a bent O-Co-O configuration (bond angle of 105 degrees).
View Article and Find Full Text PDFJ Opt Soc Am A Opt Image Sci Vis
December 2007
The optical constants of Yb films have been determined in the 23-1700 eV spectral range from transmittance measurements performed in situ on Yb films deposited by evaporation in ultrahigh vacuum conditions. Yb films were deposited over grids coated with a thin carbon film. Transmittance measurements were used to obtain the extinction coefficient of Yb films at each individual photon energy investigated.
View Article and Find Full Text PDFJ Opt Soc Am A Opt Image Sci Vis
November 2006
The transmittance of thin films of Sc deposited by evaporation in ultrahigh vacuum conditions has been investigated in the 20-1000 eV spectral range. Transmittance measurements were performed in situ on Sc layers that were deposited over grids coated with a C support film. Transmittance measurements were used to obtain the extinction coefficient of Sc films at each individual photon energy investigated.
View Article and Find Full Text PDFIn this article the adsorption of 3-methylthiophene on planar and nanoparticle Au surfaces is investigated. The resulting systems are compared with a benchmark system based on 1-decanethiol. The characterization data collected evidence the formation of a packed 3-methylthiophene SAM on the planar surface.
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