X-ray diffraction has been used to probe the radiolytic corrosion of uranium dioxide. Single crystal thin films of UO(2) were exposed to an intense X-ray beam at a synchrotron source in the presence of water, in order to simultaneously provide radiation fields required to split the water into highly oxidising radiolytic products, and to probe the crystal structure and composition of the UO(2) layer, and the morphology of the UO(2)/water interface. By modeling the electron density, surface roughness and layer thickness, we have been able to reproduce the observed reflectivity and diffraction profiles and detect changes in oxide composition and rate of dissolution at the Ångström level, over a timescale of several minutes.
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