Effects of a cancer prevention education program on elementary school students' knowledge, attitude, self-efficacy, and intentions in South Korea.

Objectives: Most children and adolescents have low levels of cancer knowledge and awareness, and infrequently engage in preventive behaviors. This study examined the effects of a short classroom-based intervention for cancer prevention on knowledge, attitude toward cancer preventability, self-efficacy, and behavioral intentions of fifth-grade elementary school students.

Methods: The study was based on a pre-post-follow-up, 2-group, quasi-experimental design.

Dielectric functions of solution-processed GdAlO(x)/Si films measured with vacuum ultra-violet spectroscopic ellipsometry.

The dielectric functions of amorphous GdAlO(x) (GAO) films grown by the sol-gel process were investigated from 1.12 to 8.5 eV as a function of annealing temperature using spectroscopic ellipsometry (SE).

Investigation of the dielectric function of solution-processed InGaZnO films using ellipsometry.

The optical properties of InGaZnO (IGZO) films grown through the sol-gel process as a function of sintering time were investigated with spectroscopic ellipsometry (SE). The IGZO precursor sol was prepared by mixing In nitrate, Ga nitrate, and Zn acetate at a molar ratio of In:Ga:Zn = 3:1:1. The solution was deposited on a SiO2/Si substrate via spin coating.

Investigation of the crystallization of amorphous Si by imaging ellipsometry.

We report results on a study of the formation of polycrystalline Si by thermally annealing amorphous Si films. The crystallization of amorphous Si is of increasing interest not only from a basic-physics point of view but also for its wide application in the semiconductor device area. The amorphous Si was deposited on a glass substrate coated with buffer layers and a small amount of Ni to stimulate crystallization.

Optical study of Mn-doped Bi4Ti3O,12 thin films by spectroscopic ellipsometry.

Mn-doped Bi4Ti3O12(B4T3) thin films grown at 400 degrees C on a Pt/Ti/SiO2/Si substrate through pulsed laser deposition (PLD) were analyzed via spectroscopic ellipsometry (SE). The PLD targets were produced through the conventional solid-state sintering method, and the film samples were annealed at 600 degrees C. The SE spectra of B4T3 films were measured using a rotating analyzer type ellipsometer within the 1.

Imaging of collapsed fatty acid films at air-water interfaces.

In situ imaging ellipsometry is employed to monitor the morphology of collapsed films of fatty acid Langmuir monolayers on pure water and on CaCl2 solution. The ellipsometry images reveal the existence of multilayer domains in the collapsed region, and analysis of the images yields the thicknesses of these domains. The multilayer films formed on water are mainly trilayers, while those on CaCl2 solution are mainly bilayers.