Scanning electrochemical microscopy (SECM) is a scanning probe microscope with an ultramicroelectrode (UME) as a probe. The technique is advantageous in the characterization of the electrochemical properties of surfaces. However, the limitations, such as slow imaging and many functions depending on the user, only allow us to use some of the possibilities.
View Article and Find Full Text PDFThe results of magnetoresistance () and resistance relaxation of nanostructured LaSrMnO (LSMO) films with different film thicknesses (60-480 nm) grown on Si/SiO substrate by the pulsed-injection MOCVD technique are presented and compared with the reference manganite LSMO/AlO films of the same thickness. The was investigated in permanent (up to 0.7 T) and pulsed (up to 10 T) magnetic fields in the temperature range of 80-300 K, and the resistance-relaxation processes were studied after the switch-off of the magnetic pulse with an amplitude of 10 T and a duration of 200 μs.
View Article and Find Full Text PDFThe results of colossal magnetoresistance (CMR) properties of LaSrMnO (LSMO) films grown by pulsed injection MOCVD technique onto various substrates are presented. The films with thicknesses of 360 nm and 60 nm grown on AT-cut single crystal quartz, polycrystalline AlO, and amorphous Si/SiO substrates were nanostructured with column-shaped crystallites spread perpendicular to the film plane. It was found that morphology, microstructure, and magnetoresistive properties of the films strongly depend on the substrate used.
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