Publications by authors named "Soe-Mie F Nee"

A simple new method is introduced to analyze the polarization of light by media. This method decomposes a Jones matrix into a linear combination of four basic matrices that represent different polarization responses. The Mueller matrix expressed in terms of the response coefficients of the basic matrices demonstrates a highly symmetric form that spells out the physical origins of each matrix element.

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The depolarization property of a biomedium with anisotropic biomolecule optical scattering is investigated theoretically. By using a simple ellipsoid model of a single biomolecule, the scattering fields and Mueller matrices are derived from fundamental electromagnetism theory. The biomedium is modeled as a system of uncorrelated anisotropic molecules.

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An accurate optical coherent ellipsometer (OCE) is proposed and setup in which a two-frequency paired linear polarized laser beam is integrated with a common-path heterodyne interferometer. This OCE is able to precisely measure the optical properties of scattering specimen by measuring ellipsometric parameters (Psi, Delta). In the mean time the degree of polarization P, and degree of coherence Chi of incident two-frequency linear polarized laser beam are measured too.

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The full polarization properties of anisotropic biomolecule optical scattering are investigated theoretically. By using a simple ellipsoid model of a single biomolecule, the scattering fields and Mueller matrices are derived from fundamental electromagnetism theory. The energy of scattered photons is not necessarily equal to that of the incident laser beam.

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The linear errors of Mueller matrix measurements, using a partially polarized light source, have been formulated for imperfections of misalignment, depolarization, and nonideal ellipsometric parameters of the polarimetric components. The error matrices for a source-polarizer system and a source-polarizer-compensator system are derived. A polarized light source, when used with an imperfect polarizer, generates extra errors in addition to those for an unpolarized source.

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A Mueller matrix for scattering by a rough plane surface of a glass hemisphere was simulated by using a micro-facet model. The algorithms are formulated in vector representation in terms of the input and output directions. The single-facet scattering simulation used the results of the Kirchhoff integral for medium rough surfaces with exponential height distribution.

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The transmittance, ellipsometric parameters, and depolarization of transmission, diffraction, and reflection of two volume holographic gratings (VHGs) are measured at a wavelength of 632.8 nm. The measured data are in good agreement with the theoretical simulated results, which demonstrated the correlation between the diffraction strength and the polarization properties of a VHG.

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The full polarization property of volume holographic grating diffraction is investigated theoretically. With a simple volume grating model, the diffracted fields and Mueller matrices are first derived from Maxwell's equations by using the Green's function algorithms. The formalism is derived for the general case that the diffraction beam and the grating wave vector are not in the plane of incidence, where s waves and p waves are not decoupled.

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We propose an ultrafast holographic Stokesmeter using a volume holographic substrate with two sets of two orthogonal gratings to identify all four Stokes parameters of the input beam. We derive the Mueller matrix of the proposed architecture and determine the constraints necessary for reconstructing the complete Stokes vector. The speed of this device is determined primarily by the channel spectral bandwidth (typically 100 GHz), corresponding to a few picoseconds.

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Error analysis for Mueller matrix measurement.

J Opt Soc Am A Opt Image Sci Vis

August 2003

The linear errors of Mueller matrix measurements are formulated for misalignment, depolarization, and incorrect retardation of the polarimetric components. The measured errors of a Mueller matrix depend not only on the imperfections of the measuring system but also on the Mueller matrix itself. The error matrices for different polarimetric systems are derived and also evaluated for the straight-through case.

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