Surg Obes Relat Dis
August 2017
Optical constants of amorphous GeO(x) films as a function of wavelength are determined for the first time, to the best of our knowledge, in thin films grown by laser deposition and dc sputtering of Ge in an oxygen environment. We determined the oxygen content of the films by combining nuclear reaction analysis and Rutherford backscattering spectrometry. Spectroscopic ellipsometry is used to determine the film optical constants.
View Article and Find Full Text PDFPhys Rev B Condens Matter
April 1993