[X-ray diffraction quantitative analysis with polynomial-fit method for polycrystalline materials].

The polynomial-fit method for XRD quantitative analysis of polycrystalline materials is presented in this paper, which combines a mathematic function model with computer technology. Based on the construction of diffraction peak mathematic function model, the XRD atlases from experiments were analyzed by means of polynomial whole pattern fitting to the spectral lines using computer software, then the integral intensities of every peak and weight percentages of each phase could be obtained accurately. This paper mainly includes three parts: 1.

Employing oxygen-plasma posttreatment to improve the laser-induced damage threshold of ZrO2 films prepared by the electron-beam evaporation method.

ZrO2 films are deposited by the electron-beam evaporation method. Parts of the prepared samples are post-treated with oxygen plasma at the environment temperature. The laser-induced damage threshold (LIDT) of the films increases from 15.