On the use of QDE-SVM for gene feature selection and cell type classification from scRNA-seq data.

Cell type identification is one of the fundamental tasks in single-cell RNA sequencing (scRNA-seq) studies. It is a key step to facilitate downstream interpretations such as differential expression, trajectory inference, etc. scRNA-seq data contains technical variations that could affect the interpretation of the cell types.

On Equivalence of FIS and ELM for Interpretable Rule-Based Knowledge Representation.

This paper presents a fuzzy extreme learning machine (F-ELM) that embeds fuzzy membership functions and rules into the hidden layer of extreme learning machine (ELM). Similar to the concept of ELM that employed the random initialization technique, three parameters of F-ELM are randomly assigned. They are the standard deviation of the membership functions, matrix-C (rule-combination matrix), and matrix-D [don't care (DC) matrix].

Evolutionary fuzzy ARTMAP neural networks for classification of semiconductor defects.

Wafer defect detection using an intelligent system is an approach of quality improvement in semiconductor manufacturing that aims to enhance its process stability, increase production capacity, and improve yields. Occasionally, only few records that indicate defective units are available and they are classified as a minority group in a large database. Such a situation leads to an imbalanced data set problem, wherein it engenders a great challenge to deal with by applying machine-learning techniques for obtaining effective solution.