Publications by authors named "Shengkai Fu"
Article Synopsis
- The study evaluates the electronic structure and thermal transport properties of 2H-CrX (X = S and Se) monolayers using density functional theory and Boltzmann transport theory, discovering that they are direct semiconductors with bandgaps of 0.91 and 0.69 eV.
- Analysis shows that these monolayers have excellent mechanical and dynamic stability, confirmed by their elastic properties and phonon dispersion curves, along with thermal stability at 300 K through molecular dynamics simulations.
- The high thermal conductivities of 131.7 and 88.6 W m K for 2H-CrS and 2H-CrSe, respectively, are linked to strong bonding, significant Young
DEP is one of promising techniques for positioning nanomaterials into the desirable location for nanoelectronic applications. In contrast, the lithography technique is commonly used to make ultra-thin conducting wires and narrow gaps but, due to the limit of patterning resolution, it is not feasible to make electrical contacts on ultra-small nanomaterials for a bottom-up device fabrication. Thus, integrating the lithography and dielectrophoresis, a real bottom-up fabrication can be achieved.
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