Mesoporous silica composites containing multiple regions with distinct pore size and complex pore organization.

Porous ceramics are of great interest for filtration, catalysis, and reactive separation processes. Performance in these applications is highly dependent on features such as pore size distribution and connectivity and wall composition. Here, we describe a method allowing the rational design and synthesis of mesoporous silica composites with controlled heterogeneous pore architectures and demonstrate its validity by producing structures with predetermined placement of regions having different pore size and pore organization.

Directed assembly of controlled-misorientation bicrystals.

Grain boundaries play a vital role in determining materials behaviour, and the nature of these intercrystalline interfaces is dictated by chemical composition, processing history, and geometry (misorientation and inclination). The interrelation among these variables and material properties may be systematically studied in bicrystals. Conventional bicrystal fabrication offers control over these variables, but its ability to mimic grain boundaries in polycrystalline materials is ambiguous.

Laser-driven formation of a high-pressure phase in amorphous silica.

Because of its simple composition, vast availability in pure form and ease of processing, vitreous silica is often used as a model to study the physics of amorphous solids. Research in amorphous silica is also motivated by its ubiquity in modern technology, a prominent example being as bulk material in transmissive and diffractive optics for high-power laser applications such as inertial confinement fusion (ICF). In these applications, stability under high-fluence laser irradiation is a key requirement, with optical breakdown occurring when the fluence of the beam is higher than the laser-induced damage threshold (LIDT) of the material.

HRTEM image simulations for the study of ultrathin gate oxides.

We have performed high resolution transmission electron microscope (HRTEM) image simulations to qualitatively assess the visibility of various structural defects in ultrathin gate oxides of MOSFET devices, and to quantitatively examine the accuracy of HRTEM in performing gate oxide metrology. Structural models contained crystalline defects embedded in an amorphous 16-A-thick gate oxide. Simulated images were calculated for structures viewed in cross section.