Publications by authors named "Sergei V Gasilov"

Several x-ray phase contrast extraction algorithms use a set of images acquired along the rocking curve of a perfect flat analyzer crystal to study the internal structure of objects. By measuring the angular shift of the rocking curve peak, one can determine the local deflections of the x-ray beam propagated through a sample. Additionally, some objects determine a broadening of the crystal rocking curve, which can be explained in terms of multiple refraction of x rays by many subpixel-size inhomogeneities contained in the sample.

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We demonstrate in-line phase-contrast imaging of nanothickness foils by using a relatively large, polychromatic, debris-free femtosecond-laser-driven cluster-based plasma soft x-ray source, and a high-resolution, large dynamic range LiF crystal detector. The spatial coherence length of radiation in our setup reached a value of 5 microm on the sample plane, which is enough to observe phase-contrast enhancement in the images registered by the detector placed only a few hundred micrometers behind the object. We have developed a tabletop soft x-ray emission source, which emits radiation within a 4pi sr solid angle, and which allows one to obtain contact and propagation-based phase-contrast imaging of nanostructures with 700 nm spatial resolutions.

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