Composite materials, particularly carbon fiber-reinforced polymers (CFRPs), have become a cornerstone in industries requiring high-performance materials due to their exceptional mechanical properties, such as high strength-to-weight ratios, and their inherent lightweight nature. These attributes make CFRPs highly desirable in aerospace, automotive, and other advanced engineering applications. However, the compressive behavior of CFRP structures remains a challenge, primarily due to the material sensitivity to structural instability, leading to matrix cracking and premature failure under compressive loads.
View Article and Find Full Text PDFScanning microwave microscopy (SMM) is a novel metrological tool that advances the quantitative, nanometric, high-frequency, electrical characterization of a broad range of materials of technological importance. In this work, we report an inverted near-field scanning microwave microscopy (iSMM) investigation of a graphene oxide-based epoxy nanocomposite material at a nanoscopic level. The high-resolution spatial mapping of local conductance provides a quantitative analysis of the sample's electrical properties.
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